Diffuse Spectral Reflectance
For accurately quantifying total hemispherical reflectance scattering from your sample materials, there is no better system available than the OL 750 configured with our integrating sphere diffuse reflectance attachment, which was specially designed to eliminate interaction errors that others ignore.
The OL 750 is an extremely versatile spectroradiometric measurement system capable of performing a variety of highly accurate optical radiation measurements under computer control in the ultraviolet, visible and infrared. The modular approach of the OL 750, coupled with an extensive selection of accessories and powerful application software packages, enables the user to tailor a turn-key system to their exact requirements as well as ensure expandability in the future.